Activation energies associated with current noise of thin metal films

Publisher Website

1 September 1988

journal article
Published by Springer Nature in Journal of Electronic Materials

Vol. 17 (5), 467-471
https://doi.org/10.1007/bf02652134

Abstract

No abstract available

Keywords

This publication has 9 references indexed in Scilit:

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Electromigration in thin gold films on molybdenum surfaces
Thin Solid Films, 1975
Screening of metal film defects by current noise measurements
Applied Physics Letters, 1973
Electromigration failure modes in aluminum metallization for semiconductor devices
Proceedings of the IEEE, 1969
Nuclear Relaxation in Aluminum
Physical Review B, 1959

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