Electromigration in thin gold films on molybdenum surfaces
- 1 February 1975
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 25 (2), 327-334
- https://doi.org/10.1016/0040-6090(75)90052-8
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Grain boundary self-diffusion in evaporated Au films at low temperaturesThin Solid Films, 1974
- Grain-boundary self-diffusion in Au by Ar sputtering techniqueJournal of Applied Physics, 1973
- Electromigration in thin gold filmsJournal of Physics F: Metal Physics, 1973
- Quantitative measurements of the mass distribution in thin films during electrotransport experimentsThin Solid Films, 1972
- Electromigration and crevice formation in thin metallic filmsThin Solid Films, 1972
- VALUE D0Z* FOR GRAIN BOUNDARY ELECTROMIGRATION IN ALUMINUM FILMSApplied Physics Letters, 1970
- Electromigration—A brief survey and some recent resultsIEEE Transactions on Electron Devices, 1969
- Electromigration in Thin Al FilmsJournal of Applied Physics, 1969
- RESISTANCE MONITORING AND EFFECTS OF NONADHESION DURING ELECTROMIGRATION IN ALUMINUM FILMSApplied Physics Letters, 1968