Characterization of GaAs FET's in Terms of Noise, Gain, and Scattering Parameters through a Noise Parameter Test Set
- 1 March 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 32 (3), 231-236
- https://doi.org/10.1109/tmtt.1984.1132658
Abstract
No abstract availableKeywords
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