On the determination of device noise and gain parameters
- 1 January 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE
- Vol. 67 (9), 1364-1366
- https://doi.org/10.1109/PROC.1979.11458
Abstract
The least-squares fitting of measured noise figures and gains versus input termination admittance is an established procedure to determine linear two-port noise and gain parameters. Unfortunately, the method is liable to the serious inconvenience of yielding often erroneous results or even results without physical meaning. Some criteria are suggested which allow the carrying out of measurements in such a manner as to safely avoid the above drawbacks.Keywords
This publication has 3 references indexed in Scilit:
- A microwave noise and gain parameter test setPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1978
- The determination of device noise parametersProceedings of the IEEE, 1969
- IRE Standards on Methods of Measuring Noise in Linear Twoports, 1959Proceedings of the IRE, 1960