A differential interferometer for force microscopy
- 1 October 1989
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 60 (10), 3131-3134
- https://doi.org/10.1063/1.1140543
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Atomic Force MicroscopePhysical Review Letters, 1986
- Surface profile measurement with a scanning differential ac interferometerApplied Optics, 1984