OFF-state degradation and correlated gate dielectric breakdown in high voltage drain extended transistors: A review
- 19 April 2014
- journal article
- review article
- Published by Elsevier in Microelectronics Reliability
- Vol. 54 (8), 1477-1488
- https://doi.org/10.1016/j.microrel.2014.03.013
Abstract
No abstract availableKeywords
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