A comprehensive model of PMOS NBTI degradation
Top Cited Papers
- 1 January 2005
- journal article
- research article
- Published by Elsevier BV in Microelectronics Reliability
- Vol. 45 (1), 71-81
- https://doi.org/10.1016/j.microrel.2004.03.019
Abstract
No abstract availableKeywords
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