Shading at different take-off angles in X-ray photoelectron spectroscopy
- 1 October 1981
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 3 (5), 191-193
- https://doi.org/10.1002/sia.740030502
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Determination of the reduced thickness of surface layers by means of the substrate methodJournal of Electron Spectroscopy and Related Phenomena, 1981
- Determination of reduced thicknesses by means of the variable take-off angle techniqueJournal of Electron Spectroscopy and Related Phenomena, 1981
- Quantitative XPS analysis without reference samplesSurface and Interface Analysis, 1979
- Application examples of calculated photoionization cross sections and mean free paths to the quantitative surface analysis by X-ray photoelectron spectroscopyAnalytical and Bioanalytical Chemistry, 1977
- Application of X-ray photoelectron spectroscopy to quantitative analysis without standardsAnalytical and Bioanalytical Chemistry, 1977
- Solid state—and surface—analysis by means oF angular-dependent x-ray photoelectron spectroscopyProgress in Solid State Chemistry, 1976
- Instrumentation for surface studies: XPS angular distributionsJournal of Electron Spectroscopy and Related Phenomena, 1974
- On the influence of surface-roughness on X-ray photoelectron intensitiesJournal of Electron Spectroscopy and Related Phenomena, 1973