Photoemission from Amorphous Silicon
- 28 September 1970
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 25 (13), 861-864
- https://doi.org/10.1103/PhysRevLett.25.861
Abstract
Measurements of photoelectric yield and energy distributions from amorphous silicon films are presented. The results are consistent with an exponential tail in the density of states extending from the valence band to the Fermi level. Mild heat treatment decreases the amplitude of this tail. Tentative explanations of these observations are given.Keywords
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