A study of interface states in metal-GaAs 〈110〉 structures by Schottky capacitance spectroscopy
- 1 November 1983
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 54 (11), 6474-6480
- https://doi.org/10.1063/1.331875
Abstract
A study of the capacitance of a forward biased Schottky diode as a function of bias, temperature, and frequency allows characterization of interface states at the metal-semiconductor junction. This method, called Schottky Capacitance Spectroscopy is applied to interfaces obtained by evaporating Au, Ag, or Al onto n-type cleaved GaAs 〈110〉 surfaces. We have explored the region of the semiconductor band gap about 1 eV below the conduction band minimum. There is evidence of three kinds of states. The energy levels of these states are quite reproducible while we have obtained a light dispersion of density of states and capture cross sections. Moreover, we have observed a correlation between the relative density of states C and the degradation of the I–V characteristic.Keywords
This publication has 22 references indexed in Scilit:
- Electronic properties of Ga/GaAs(110) upon interface formationSurface Science, 1982
- Fermi level pinning on (110) GaAs surfaces studied by CPD and SPV topographiesJournal of Vacuum Science and Technology, 1981
- The surface electronic structure of 3–5 compounds and the mechanism of Fermi level pinning by oxygen (passivation) and metals (Schottky barriers)Surface Science, 1979
- Interface states in a cleaved metal-silicon junctionJournal of Applied Physics, 1979
- Study of PtGaAs interface statesSolid-State Electronics, 1978
- New phenomena in Schottky barrier formation on III–V compoundsJournal of Vacuum Science and Technology, 1978
- Interfacial states spectrum of a metal-silicon junctionSolid-State Electronics, 1976
- Observation of extrinsic surface states on (1120) CdSSurface Science, 1975
- Determination of the density and the relaxation time of silicon-metal interfacial statesSolid-State Electronics, 1975
- Electron spectroscopy of GaAs and AlAs surfacesSurface Science, 1975