Interfacial states spectrum of a metal-silicon junction
- 31 January 1976
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 19 (1), 73-75
- https://doi.org/10.1016/0038-1101(76)90135-0
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Surface-state spectra from thick-oxide MOS tunnel junctionsSolid-State Electronics, 1974
- Characterization of the interface states at a Ag/Si interface from capacitance measurementsJournal of Applied Physics, 1974
- Density of states and barrier height of metal-Si contactsJournal of Physics C: Solid State Physics, 1971
- METAL-DEPENDENT INTERFACE STATES IN THIN MOS STRUCTURESApplied Physics Letters, 1971
- Surface States on Clean and on Cesium‐Covered Cleaved Silicon SurfacesPhysica Status Solidi (b), 1970
- The Si-SiO2Interface - Electrical Properties as Determined by the Metal-Insulator-Silicon Conductance TechniqueBell System Technical Journal, 1967