Secondary-ion yields from surfaces bombarded with keV molecular and cluster ions
- 9 October 1989
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 63 (15), 1625-1628
- https://doi.org/10.1103/physrevlett.63.1625
Abstract
We have measured negative secondary-ion yields from phenylalanine, CsI, and Au bombarded by complex ions of 5–28 keV. The primary ions were organic monomer and dimer ions and clusters of CsI. Large enhancements occur in the measured secondary-ion yields for more complex projectiles. We show that secondary-ion yields of atomic species are related to the square of the projectile momentum.
Keywords
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