Piezospectroscopic determination of the ratio of the electron-phonon to hole-phonon scattering matrix elements for LA and TA phonons in GaP
- 15 January 1982
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 25 (2), 1179-1192
- https://doi.org/10.1103/physrevb.25.1179
Abstract
An investigation of the stress dependence of the amplitude of the normalized wavelength-modulated absorption spectra of the phonon-assisted (LA, TA, and TO) indirect transition in GaP at 77 K has been performed. Theoretical expressions, which include the stress-dependent mixing between the top of the valence band () and its spin-orbit splitoff band () have been calculated for the intensities of the allowed phonon-assisted (LA, TA, TO, and LO) transitions. From the experimental results for and , and the above theoretical expressions, the ratio of the electron-phonon (-ph) to hole-phonon (-ph) scattering matrix elements has been obtained for the LA and TA phonons. For the LA phonon the ratio was found to be and for the TA phonon .
Keywords
This publication has 15 references indexed in Scilit:
- Deformation potentials of the direct and indirect absorption edges of GaPPhysical Review B, 1979
- Indirect exciton fine structure in GaP and the effect of uniaxial stressPhysical Review B, 1978
- Piezo-spectroscopic determination of the ratio of electron—To phonon to hole—To phonon interaction in siliconSolid State Communications, 1978
- Determination of the mass-anisotropy exciton splitting in siliconSolid State Communications, 1977
- Effects of uniaxial stress on the electroreflectance spectrum of Ge and GaAsPhysical Review B, 1977
- Modulation spectroscopy under uniaxial stressSurface Science, 1973
- Effects of Uniaxial Stress on the Indirect Exciton Spectrum of SiliconPhysical Review B, 1971
- Deformation Potentials of the Indirect and Direct Absorption Edges of AlSbPhysical Review B, 1970
- Intrinsic Absorption-Edge Spectrum of Gallium PhosphidePhysical Review B, 1966
- Influence of Uniaxial Stress on the Indirect Absorption Edge in Silicon and GermaniumPhysical Review B, 1966