Charge and potential distribution in dielectric layers of MOS structures under ionization
- 16 December 1974
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 26 (2), 743-752
- https://doi.org/10.1002/pssa.2210260240
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Effects of ionizing radiation on MOS devicesSolid-State Electronics, 1969
- Radiation-induced space-charge buildup in MOS structuresIEEE Transactions on Electron Devices, 1967
- Effects of ionizing radiation on oxidized silicon surfaces and planar devicesProceedings of the IEEE, 1967
- Crystallinity and Electronic Properties of Evaporated CdS FilmsJournal of Applied Physics, 1963
- Rectification and space-charge-limited currents in CdS filmsSolid-State Electronics, 1962