Direct Measurements of the Mobilities of Edge and Screw Dislocations in Fe-3%Si Alloy by High Voltage Electron Transmission Microscopy
- 1 May 1969
- journal article
- Published by Physical Society of Japan in Journal of the Physics Society Japan
- Vol. 26 (5), 1327
- https://doi.org/10.1143/jpsj.26.1327
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- A Direct Method to Investigate the Dynamical Properties of Dislocations Based on High Voltage Electron MicroscopyJapanese Journal of Applied Physics, 1969
- On the Preparation of Tensile Test Pieces for Transmission Electron Microscopic ObservationJapanese Journal of Applied Physics, 1969
- Stress Measurable Tensile Device for Electron Microscopic ObservationJournal of the Physics Society Japan, 1968
- Mobility of Edge Dislocations in Silicon-Iron CrystalsJournal of Applied Physics, 1960