Electrical characterization of electron irradiated X-rays detectors based on 4H-SiC epitaxial layers
- 31 March 2004
- journal article
- research article
- Published by Elsevier BV in Diamond and Related Materials
- Vol. 13 (3), 414-418
- https://doi.org/10.1016/j.diamond.2003.11.079
Abstract
No abstract availableKeywords
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