Observation of stepwise variations of the lattice parameter on GaxIn1−xAsyP1−y layers grown by liquid phase epitaxy on (100) InP

Abstract
Epitaxial GaxIn1−xAsyP1−y layers several microns thick have been grown on (100) InP substrates by ramp cooling. Using high‐resolution double x‐ray diffractometry, the profiles obtained from such layers could be resolved into several peaks. Chemical thinning of the layers allowed these peaks to be attributed to successive sublayers having slightly different perpendicular lattice parameters, the lattice parameter within each sublayer being constant.