Electromigration in thin gold films
- 1 April 1969
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 16 (4), 407-410
- https://doi.org/10.1109/t-ed.1969.16766
Abstract
Electromigration in gold film conductors results in regions of material accumulation and depletion. These regions arise from and are correlated with the thermal gradients along the conductor. This result is in contrast with the observations on aluminum conductors where the effect is dominated by the structure or metallurgical properties of the film.Keywords
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