In situ rutherford backscattering spectroscopy for electrochemical interphase analysis
- 28 February 1986
- journal article
- Published by Elsevier in Electrochimica Acta
- Vol. 31 (2), 169-172
- https://doi.org/10.1016/0013-4686(86)87104-3
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Cation insertion reactions of electrochromic tungsten and iridium oxide filmsPhysical Review B, 1982
- Application of rutherford backscattering to non-destructive analysis of insoluble oxide electrodesJournal of Electroanalytical Chemistry and Interfacial Electrochemistry, 1982
- A review of surface spectroscopies for semiconductor characterizationJournal of Vacuum Science and Technology, 1982
- Oxidation of Ti Thin Films Deposited on Vitreous CarbonJournal of the Electrochemical Society, 1981
- Analysis of Pb on Ag by Rutherford backscatteringSurface Science, 1981
- The Use of Rutherford Backscattering Spectroscopy for Characterization of Surface Films Produced by Aluminum/Water ReactionsJournal of the Electrochemical Society, 1981
- Non-traditional approaches to the study of solid-electrolyte interfaces: Problem overviewSurface Science, 1980
- Investigation of ionic movements during anodic oxidation of superimposed metallic layers by the use of rutherford backscattering techniques and nuclear microanalysisCorrosion Science, 1980
- Anisotropic etching of siliconIEEE Transactions on Electron Devices, 1978