High field related thin oxide wearout and breakdown
- 1 April 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 42 (4), 760-772
- https://doi.org/10.1109/16.372082
Abstract
No abstract availableThis publication has 47 references indexed in Scilit:
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