Probing the local structure and bonding at interfaces and defects using EELS in the TEM
- 1 December 1995
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 180 (3), 238-249
- https://doi.org/10.1111/j.1365-2818.1995.tb03683.x
Abstract
No abstract availableKeywords
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