Spatially resolved electron energy-loss near-edge structure analysis of a near Σ = 11 tilt boundary in sapphire
Open Access
- 1 January 1993
- journal article
- Published by EDP Sciences in Microscopy Microanalysis Microstructures
- Vol. 4 (1), 23-39
- https://doi.org/10.1051/mmm:019930040102300
Abstract
No abstract availableKeywords
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