The graphical reliability evaluation of three-state device networks
- 1 April 1975
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 14 (2), 203-214
- https://doi.org/10.1016/0026-2714(75)90032-3
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Redundancy and the Detection of First FailuresIRE Transactions on Reliability and Quality Control, 1962
- Reliability of Parallel Electronic ComponentsIRE Transactions on Reliability and Quality Control, 1960