Surface X-ray diffraction
- 1 May 1992
- journal article
- Published by IOP Publishing in Reports on Progress in Physics
- Vol. 55 (5), 599-651
- https://doi.org/10.1088/0034-4885/55/5/002
Abstract
A general introduction to X-ray diffraction and its application to the study of surfaces and interfaces is presented. The application of X-ray diffraction to various problems in surface and interface science is illustrated through five different techniques: crystal truncation rod analysis; two-dimensional crystallography; three-dimensional structure analysis; the evanescent wave method; and lineshape analysis. These techniques are explained with numerous examples from experiments and with the aid of an extensive bibliography.Keywords
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