Fundamental studies elucidating anodic barrier-type film growth on aluminium
- 1 January 1985
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 123 (2), 127-133
- https://doi.org/10.1016/0040-6090(85)90014-8
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Electron Energy Loss Spectroscopy of a Barrier‐Type Film Formed on Aluminum in Oxalate SolutionJournal of the Electrochemical Society, 1983
- Barrier‐Type anodic films on aluminium in aqueous borate solutions: 1—Film density and stopping power of anodic alumina films for alpha particlesSurface and Interface Analysis, 1983
- Barrier‐type anodic films on aluminium in aqueous borate solutions: 2—Film compositions by Rutherford backscattering spectroscopy and nuclear reaction methodsSurface and Interface Analysis, 1983
- Preparation of self-supporting anodic barrier films on aluminium for backscattering analysisSurface and Interface Analysis, 1982
- The electrical breakdown during anodizing of high purity aluminium in borate solutionsThin Solid Films, 1982
- Direct observations of ion-implanted xenon marker layers in anodic barrier films on aluminiumThin Solid Films, 1982
- STEM/EDAX analysis of a barrier film formed on aluminiumElectrochimica Acta, 1981
- Electron-Beam-Induced crystallization of anodic barrier films on aluminiumThin Solid Films, 1981
- The application of ultramicrotomy to the electronoptical examination of surface films on aluminiumCorrosion Science, 1978
- A study of barrier film growth on aluminium in solutions of film-promoting and aggressive ions using secondary ion mass spectrometryCorrosion Science, 1976