Characterization of glass surfaces by electron spectroscopy
- 1 March 1975
- journal article
- Published by Elsevier in Surface Science
- Vol. 48 (1), 22-43
- https://doi.org/10.1016/0039-6028(75)90308-8
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
- Ion scattering spectrometry below 10 keVThin Solid Films, 1973
- Ion Scattering SpectrometryJournal of Vacuum Science and Technology, 1973
- Secondary ion mass analysis, Technique for three-dimensional characterizationAnalytical Chemistry, 1972
- New Methods for Studying Glass Corrosion KineticsApplied Spectroscopy, 1972
- Investigation of low-energy ion scattering as a surface analytical techniqueSurface Science, 1972
- Analysis of surface composition with low-energy backscattered ionsSurface Science, 1971
- Analysis of surfaces utilizing sputter ion source instrumentsSurface Science, 1971
- Analytic methods for the ion microprobe mass analyzer. Part II.International Journal of Mass Spectrometry and Ion Physics, 1970
- Comparison of Surface and Bulk Glass Composition with the Spark Source Mass SpectrometerJournal of the American Ceramic Society, 1968
- Solid-State Energy-Dispersion Spectrometer for Electron-Microprobe X-ray AnalysisScience, 1968