Transmission electron microscope observations of extended and unextended dislocation nodes in Si and Ge/Si layers using the weak-beam technique
- 1 July 1973
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 98 (2), 191-195
- https://doi.org/10.1111/j.1365-2818.1973.tb03822.x
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- The dissociation of dislocations in siliconProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1971
- The electron microscope image contrast near dislocation nodesPhilosophical Magazine, 1967
- Observations on dislocation nodes in siliconPhilosophical Magazine, 1965
- Shape of three-fold extended nodesDiscussions of the Faraday Society, 1964
- Stacking Fault Energy in SiliconJournal of Applied Physics, 1962
- Dislocation interactions in face-centred cubic metals, with particular reference to stainless steelProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1959