Compact stand-alone atomic force microscope
- 1 October 1993
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 64 (10), 2892-2897
- https://doi.org/10.1063/1.1144378
Abstract
A stand‐alone atomic force microscope (AFM) featuring large scan, friction measurement, atomic resolution, and liquid operation, has been developed. Cantilever displacements are measured using the optical beam deflection method. The laser diode and focusing lens are positioned inside the piezo tube and the cantilever at the end of the piezo tube. Because the laser beam stays on the cantilever during scanning, the scan range is solely determined by the characteristics of the piezo tube. In our case 30×30×9.5 μm3 (xyz). The optical beam deflection detection method allows simultaneous measurement of height displacements and torsion (induced by lateral forces) of the cantilever. AFM images of dried lymphocytes reveal features in the torsion images, which are only faintly visible in the normal height images. A new way of detecting the nonlinear behavior of the piezo tube is described. With this information the piezo scan is linearized. The nonlinearity in a 30‐μm scan is reduced from 40% to about 1%, as is illustrated with images of a compact disk. The stand‐alone AFM can be combined with a (confocal) inverted microscope, yielding a versatile setup for biological applications.Keywords
This publication has 17 references indexed in Scilit:
- Scanned-cantilever atomic force microscopeReview of Scientific Instruments, 1993
- Polymerized LB films imaged with a combined atomic force microscope-fluorescence microscopeLangmuir, 1992
- Improved atomic force microscope using a laser diode interferometerReview of Scientific Instruments, 1992
- A stand-alone scanning force and friction microscopeUltramicroscopy, 1992
- New imaging mode in atomic-force microscopy based on the error signalPublished by SPIE-Intl Soc Optical Eng ,1992
- Atomic force microscope with integrated optical microscope for biological applicationsReview of Scientific Instruments, 1992
- Electromechanical deflections of piezoelectric tubes with quartered electrodesApplied Physics Letters, 1992
- Combined scanning force and friction microscopy of micaNanotechnology, 1990
- Erratum: Novel optical approach to atomic force microscopy [Appl. Phys. Lett. 5 3, 1045 (1988)]Applied Physics Letters, 1988
- Compact scanning-force microscope using a laser diodeOptics Letters, 1988