THRESHOLD SWITCHING AND THERMAL FILAMENTS IN AMORPHOUS SEMICONDUCTORS
- 15 January 1970
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 16 (2), 72-73
- https://doi.org/10.1063/1.1653105
Abstract
Threshold switching in a thick specimen of an amorphous semiconductor was studied. With the aid of an infrared viewer, the existence of a thermal filament during switching was confirmed. By spectralanalysis, the temperature of this filament was estimated to be between 650 and 800 °C. No crystals were observed in the nonoxide glass, either before or after switching had occurred.Keywords
This publication has 5 references indexed in Scilit:
- BULK AND THIN FILM SWITCHING AND MEMORY EFFECTS IN SEMICONDUCTING CHALCOGENIDE GLASSESApplied Physics Letters, 1969
- FILAMENTARY CONDUCTION IN SEMICONDUCTING GLASS DIODESApplied Physics Letters, 1969
- Reversible Electrical Switching Phenomena in Disordered StructuresPhysical Review Letters, 1968
- Electrical Conduction Anomaly of Semiconducting Glasses in the System As—Te—IJournal of the American Ceramic Society, 1964
- Specific Negative Resistance in SolidsProceedings of the Physical Society, 1963