Experimental Investigation of a Linear 500-Element 3-Phase Charge-Coupled Device
- 1 April 1974
- journal article
- website
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Bell System Technical Journal
- Vol. 53 (4), 581-610
- https://doi.org/10.1002/j.1538-7305.1974.tb02759.x
Abstract
A linear, 500-element, 3-phase charge-coupled device, originally built as a high-resolution linear image sensor, has been chosen as a representative structure for single-level, 3-phase charge-coupled devices to exemplify the performance of such devic...Keywords
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