Use of charge-coupled devices for delaying analog signals
- 1 April 1973
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 8 (2), 151-157
- https://doi.org/10.1109/jssc.1973.1050364
Abstract
No abstract availableThis publication has 32 references indexed in Scilit:
- Spectral density of noise generated in charge transfer devicesIEEE Transactions on Electron Devices, 1973
- A charge-coupled area image sensor and frame storeIEEE Transactions on Electron Devices, 1973
- Measurements of Transfer Inefficiency of 250-Element Undercut-Isolated Charge Coupled DevicesBell System Technical Journal, 1973
- Two-phase charge-coupled shift registersPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1972
- Two-phase m.n.o.s. charge-coupled deviceElectronics Letters, 1972
- Implanted-Barrier Two-Phase Charge-Coupled DeviceApplied Physics Letters, 1971
- Charge-coupled imaging devices: Design considerationsIEEE Transactions on Electron Devices, 1971
- Charge-coupled digital circuitsIEEE Journal of Solid-State Circuits, 1971
- SURFACE CHARGE TRANSPORT IN SILICONApplied Physics Letters, 1970
- Low frequency noise in MOS transistors—I TheorySolid-State Electronics, 1968