Temperature effects for Ti/GaAs(110) interface formation involving cluster and atom deposition
- 15 August 1989
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 40 (5), 2932-2939
- https://doi.org/10.1103/physrevb.40.2932
Abstract
Ti/GaAs(110) interfaces formed at 60 and 300 K by atom-by-atom deposition and by the deposition of preformed metallic clusters exhibit very different Schottky-barrier behavior and morphologies. For atom deposition, temperature-dependent Fermi-level pinning is similar to that observed for nonreactive metals, despite the fact that the deposition process leads to the disruption of ∼3 monolayers of GaAs at all temperatures. Although disruption is apparent even at 0.02 Å, atom deposition at 60 K on n-type GaAs shows almost no Fermi-level movement until ∼2 Å when moves rapidly toward midgap. Our results show that the adatoms do not act as nonreactive donors at low temperature, that thermal changes do not quench surface chemistry, and that surface reaction alone does not lead to midgap pinning. In contrast, for interfaces formed by preformed Ti cluster deposition, unique pinning positions are observed far from the point expected for known defects or metal-induced gap states. The instability of the Ti(cluster)/GaAs system is demonstrated by warming to 300 K. We postulate that kinetically restricted reactions occur beneath the metallic clusters and the midgap pinning requires disruption in the presence of a metallic overlayer.
Keywords
This publication has 31 references indexed in Scilit:
- The advanced unified defect model for Schottky barrier formationJournal of Vacuum Science & Technology B, 1988
- Schottky contacts to cleaved GaAs (110) surfaces. I. Electrical properties and microscopic theoriesJournal of Physics C: Solid State Physics, 1988
- Role of virtual gap states and defects in metal-semiconductor contactsPhysical Review Letters, 1987
- The kinetics of Schottky barrier formation: Al on low-temperature GaAs(110)Solid State Communications, 1986
- The effects of microstructure on interface characterizationSurface Science, 1986
- Calculation of Schottky barrier heights from semiconductor band structuresSurface Science, 1986
- Recent models of Schottky barrier formationJournal of Vacuum Science & Technology B, 1985
- GaAs(110) -Al INTERFACES FORMED AT LOW TEMPERATURELe Journal de Physique Colloques, 1984
- Schottky barriers: Models and “tests”Surface Science, 1983
- The structure and properties of metal-semiconductor interfacesSurface Science Reports, 1982