Perpendicular and longitudinal magnetic properties and crystallographic orientation of Co-Cr film

Abstract

The magnetic properties and the c axis orientation of Co-Cr thin films deposited on various substrates with concentrations of 0–20 at. % Cr are investigated. The intermediate layer of C,5 nm thick, between the substrate and Co-Cr layer is found to bring a great improvement in the c-axis orientation toward the normal of the film plane, a situation suitable for perpendicular recording. On the other hand, the thicker the underlayer of Cr, the better the c-axis orientation and a higher coercivity in the film plane is realized; this is suitable for longitudinal recording.