Localized defects in p-CdTe:Cu doped by copper incorporation during Bridgman growth
- 30 September 1988
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 67 (12), 1127-1130
- https://doi.org/10.1016/0038-1098(88)91069-1
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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