Admittance spectroscopy: A powerful characterization technique for semiconductor crystals—Application to ZnTe
- 1 November 1980
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 23 (11), 1159-1169
- https://doi.org/10.1016/0038-1101(80)90028-3
Abstract
No abstract availableKeywords
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