Direct Examination of Ceramic Surfaces with the Scanning Electron Microscope
- 1 September 1962
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 45 (9), 425-428
- https://doi.org/10.1111/j.1151-2916.1962.tb11187.x
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Sintering Crystalline Solids. I. Intermediate and Final State Diffusion ModelsJournal of Applied Physics, 1961
- Factors Affecting Contrast and Resolution in the Scanning Electron Microscope†Journal of Electronics and Control, 1959
- Growth and Defect Structure of Sapphire MicrocrystalsJournal of Applied Physics, 1957
- LIII. The Examination of p-n Junctions with the Scanning Electron Microscope†Journal of Electronics and Control, 1957
- An improved scanning electron microscope for opaque specimensProceedings of the IEE - Part II: Power Engineering, 1953