The application of scanning transmission electron microscopy to the study of thin ferromagnetic films
- 1 March 1974
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 7 (3), 181-182
- https://doi.org/10.1088/0022-3735/7/3/014
Abstract
A scanning attachment for a transmission electron microscope is used to investigate domain structures in thin ferromagnetic films. Contrast mechanisms similar to those employed in the transmission microscope are demonstrated and a brief comparison of the techniques is made.Keywords
This publication has 3 references indexed in Scilit:
- Some techniques of transmission Lorentz microscopyJournal of Physics E: Scientific Instruments, 1969
- High-voltage electron microscope observation of stripe domains in permalloy films evaporated at oblique incidenceThin Solid Films, 1968
- Direct observation of magnetic domains by scanning electron microscopyPhilosophical Magazine, 1968