Time dependent breakdown of ultrathin gate oxide
- 1 July 2000
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 47 (7), 1416-1420
- https://doi.org/10.1109/16.848285
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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