Enhancement in PIXE analysis
- 15 April 1977
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 142 (1-2), 61-65
- https://doi.org/10.1016/0029-554x(77)90809-6
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Proton-induced X-ray emission in the trace analysis of human tooth enamel and dentineThe International Journal of Applied Radiation and Isotopes, 1976
- Intercomparison of trace element determinations in simulated and real air particulate samplesX-Ray Spectrometry, 1975
- Elemental trace analysis of small samples by proton induced x-ray emissionAnalytical Chemistry, 1975
- X-ray production by 1.5–11 MeV protonsThe European Physical Journal A, 1974
- Proton induced X-ray emission as a tool for trace element analysisNuclear Instruments and Methods, 1974
- Photon cross sections from 0.1 keV to 1 MeV for elements Z = 1 to Z = 94Atomic Data and Nuclear Data Tables, 1973
- X-Ray Fluorescence Yields, Auger, and Coster-Kronig Transition ProbabilitiesReviews of Modern Physics, 1972
- X-Ray Transition-Probability Ratios for ElementsPhysical Review A, 1972
- Range and stopping-power tables for heavy ionsAtomic Data and Nuclear Data Tables, 1970
- K x-ray transition probabilitiesAtomic Data and Nuclear Data Tables, 1969