Non-stoichiometry of MoS2 phase prepared by sputtering
- 1 June 1978
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine Part B
- Vol. 37 (6), 773-775
- https://doi.org/10.1080/01418637808225655
Abstract
The lattice parameters and S/Mo atomic ratio in sputtered MoS2 films have been examined as a function of sputtering conditions, especially the vacuum pressure in the chamber. It was found that the deposited films had a defect MoS2 structure ranging from 1.6 to 2 in S/Mo ratio, depending on the pressure.Keywords
This publication has 1 reference indexed in Scilit:
- Quantitative Electron Probe Microanalysis of Thin FilmsTransactions of the Japan Institute of Metals, 1975