Enhanced interband recombination in Pb1−xSnxTe

Abstract
Photoconductive measurements have been performed on Pb1−xSnxTe in the small‐energy‐gap region. Experimentally observed shortening of the photoconductive lifetime is inferred to occur as a result of strong coupling of photoexcited carriers to some elementary excitations (phonon and phonon‐plasmon modes) in the material. Applications to fast infrared detectors are discussed.
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