Reliability and Failure Mechanisms of Nonhermetic Aluminum SIC's: Literature Review and Bias Humidity Performance
- 1 June 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Hybrids, and Manufacturing Technology
- Vol. 6 (2), 181-190
- https://doi.org/10.1109/tchmt.1983.1136166
Abstract
No abstract availableThis publication has 34 references indexed in Scilit:
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