Field-ion microscopy-a review of basic principles and selected applications
- 1 December 1982
- journal article
- review article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 15 (12), 1281-1294
- https://doi.org/10.1088/0022-3735/15/12/004
Abstract
The following topics related to field-ion microscopy (FIM) are dealt with: image magnification; imaging capabilities; field ionisation; field-ion energy distributions; the hopping gas model; image resolution; field evaporation; the field-desorption microscope; microchannel plate image intensification; the atom-probe FIM; surface diffusion in the FIM; and biomolecular imaging.Keywords
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