The physical basis for the roller‐coaster hazard rate curve for electronics
- 1 November 1991
- journal article
- Published by Wiley in Quality and Reliability Engineering International
- Vol. 7 (6), 489-495
- https://doi.org/10.1002/qre.4680070609
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- The bathtub does not hold water any moreQuality and Reliability Engineering International, 1988
- Critical area and critical levels calculation in IC yield modelingIEEE Transactions on Electron Devices, 1988
- The reliability of semiconductor devices in the bell systemProceedings of the IEEE, 1974