Determination of silicon unit cell parameters by precision measurements of Bragg plane spacings
- 1 December 1984
- journal article
- research article
- Published by Springer Nature in Zeitschrift für Physik B Condensed Matter
- Vol. 56 (4), 273-278
- https://doi.org/10.1007/bf01306634
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Oscillatory structure of laue case rocking curvesPhysica Status Solidi (a), 1977
- High precision lattice parameter measurements by multiple Bragg reflexion diffractometryProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1969
- Elements of X-Ray DiffractionAmerican Journal of Physics, 1957