Scanning electron microscopy studies on switching lateral transistors in integrated circuits
- 30 June 1971
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 14 (6), 481-486
- https://doi.org/10.1016/0038-1101(71)90058-x
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Switching phenomenon observed in lateralp–n–ptransistorsElectronics Letters, 1968