Principal component analysis for refractory metal silicide investigations with auger electron spectroscopy
- 16 April 1984
- journal article
- structure
- Published by Wiley in Physica Status Solidi (a)
- Vol. 82 (2), 373-378
- https://doi.org/10.1002/pssa.2210820205
Abstract
No abstract availableKeywords
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- Principal component analysis of Auger line shapes at solid—solid interfacesApplications of Surface Science, 1981
- Investigation of NiSi and Pd3Si thin films by AES and XPSPhysica Status Solidi (a), 1980
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- Investigation of phase-growth kinetics during interaction of silicon single crystals and molybdenum thin filmsTalanta, 1977