Refractive index of inhomogeneous films
- 1 June 1970
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 21 (174), 1229-1235
- https://doi.org/10.1080/14786437008238507
Abstract
A suggested form for the inhomogeneity found in certain thin films is a bilayer structure with a boundary layer of different refractive index from that of the main film. This boundary layer lies between the main film and the substrate. A simple formula is deduced to allow calculation of the index of this layer. For zinc sulphide the calculated results agree well with the possibility of the boundary layer being zinc oxide.Keywords
This publication has 14 references indexed in Scilit:
- Optical Film Materials and Their ApplicationsJournal of Vacuum Science and Technology, 1967
- Role of Condensation Phenomena in the Measurement of Film Thickness by the Oscillating Quartz Crystal MethodJournal of Applied Physics, 1966
- Measurement of the Refractive Indices of Several CrystalsJournal of Applied Physics, 1965
- On the production and properties of inhomogeneous thin filmsJournal de Physique, 1964
- Dielectric Anomaly in ZnS FilmsJournal of Applied Physics, 1962
- Optical properties of thin filmsReports on Progress in Physics, 1960
- Dielectric Thin Films*Journal of the Optical Society of America, 1957
- Sur la mise en évidence de la biréfringence de couches minces de fluorure de calcium obtenues par évaporation thermiqueJournal de Physique et le Radium, 1957
- Etude des Propriétés Optiques des Couches Minces Transparentes en Liaison avec leur StructureOptica Acta: International Journal of Optics, 1956
- La détermination de l'indice et de l'épaisseur des couches minces transparentesJournal de Physique et le Radium, 1950