Detection of thermal waves through modulated optical transmittance and modulated optical scattering
- 15 February 1986
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 59 (4), 1392-1394
- https://doi.org/10.1063/1.336486
Abstract
We show that variations in local optical constants induced by the presence of thermal waves can be used for thermal wave detection and analysis through measurements of thermal wave-induced modulated transmittance and scattering.Keywords
This publication has 15 references indexed in Scilit:
- Thermal and plasma wave depth profiling in siliconApplied Physics Letters, 1985
- Detection of thermal waves through optical reflectanceApplied Physics Letters, 1985
- Time-Resolved Reflectivity Measurements of Femtosecond-Optical-Pulse-Induced Phase Transitions in SiliconPhysical Review Letters, 1983
- Picosecond time-resolved plasma and temperature-induced changes of reflectivity and transmission in siliconApplied Physics Letters, 1982
- Photothermal deflection spectroscopy and detectionApplied Optics, 1981
- Optically detected photothermal imagingApplied Physics Letters, 1981
- Picosecond Ellipsometry of Transient Electron-Hole Plasmas in GermaniumPhysical Review Letters, 1974
- New Thermooptical Measurement Method and a Comparison with Other MethodsApplied Optics, 1973
- Temperature-Modulated Optical Absorption in SemiconductorsJournal of Applied Physics, 1966
- Long-Transient Effects in Lasers with Inserted Liquid SamplesJournal of Applied Physics, 1965