Electron paramagnetic resonance studies of composite dielctric films of SiO and B2O3
- 15 August 1979
- journal article
- research article
- Published by Elsevier in Thin Solid Films
- Vol. 61 (3), L17-L19
- https://doi.org/10.1016/0040-6090(79)90488-7
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Electron diffraction study of low loss dielectric filmsThin Solid Films, 1974
- Electrical properties of silicon oxide/boric oxide co-evaporated filmsThin Solid Films, 1972
- An electron spin resonance study of reactively evaporated silicon oxideThin Solid Films, 1971
- A low-loss thin film capacitorThin Solid Films, 1971